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General Information and Usage:
The Electrochemical C-V Profiler (ECV) employs electrochemical etching to determine the electrical carrier concentration as a function of depth in compound semiconductors. By making use of a well-defined electrochemical dissolution reaction, the semiconductor can be profiled to any depth at a controlled rate. The semiconductor/electrolyte interface behaves as a Schottky diode across which C-V measurements are performed. By using the electrolyte to both etch and form a Schottky contact with the semiconductor, one can obtain the depth profile of the carrier concentration in the semiconductor.
Complete BioRad Manual
Contact Information for Users of PRISM Micro/Nano Fabrication Lab:
For additional information regarding the BioRad/ECV Profiler, please contact the PRISM Staff at: PRISM-CLEANRM-OPS@princeton.edu
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